DAS, R. S. A Review of Artificial Intelligence Techniques for Quality Control in Semiconductor Production. International Journal of Computing and Engineering, [S. l.], v. 5, n. 3, p. 33–45, 2024. DOI: 10.47941/ijce.1815. Disponível em: https://www.carijournals.org/journals/index.php/IJCE/article/view/1815. Acesso em: 18 may. 2024.