DAS, R. S.; CHOWDHURY, A. P. Enhancing Semiconductor Functional Verification with Deep Learning with Innovation and Challenges. International Journal of Computing and Engineering, [S. l.], v. 5, n. 3, p. 22–32, 2024. DOI: 10.47941/ijce.1814. Disponível em: https://www.carijournals.org/journals/index.php/IJCE/article/view/1814. Acesso em: 18 may. 2024.